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Gate oxide
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Gate oxide
RIS
0.002
(Research Intensity Score)
Papers
455
Top papers
Interface States in Gate Stack of Carbon Nanotube Array Transistors
2024 · 38 citations
A native oxide high-κ gate dielectric for two-dimensional electronics
2020 · 303 citations
High-Performance Thin-Film Transistor with Atomic Layer Deposition (ALD)-Derived Indium–Gallium Oxide Channel for Back-End-of-Line Compatible Transistor Applications: Cation Combinatorial Approach
2022 · 73 citations
MoS 2 Transistors with 4 nm hBN Gate Dielectric and 0.46 V Threshold Voltage
2025 · 14 citations
High V TH and Improved Gate Reliability in P-GaN Gate HEMTs With Oxidation Interlayer
2023 · 42 citations
Achieving 1-nm-Scale Equivalent Oxide Thickness Top-Gate Dielectric on Monolayer Transition Metal Dichalcogenide Transistors With CMOS-Friendly Approaches
2025 · 15 citations
A Review on Gate Oxide Failure Mechanisms of Silicon Carbide Semiconductor Devices
2024 · 16 citations
Gate Robustness and Reliability of P-Gate GaN HEMT Evaluated by a Circuit Method
2024 · 27 citations
MoS 2 transistors with 1-nanometer gate lengths
2016 · 1480 citations
Newest papers
High-κ Nb2O5 gate dielectric with Al2O3 interfacial passivation and Pt/PtOx gate for GaN-based MOS devices
2026
Homoepitaxial GaN-on-GaN trench MOSFETs with 438 MW/cm2 figure of merit and improved gate reliability
2026
Understanding the impact of vdW gap on the reliability of nanoscale MoS2 FETs by TCAD modeling
2026
Wafer-scale 2D MoS2 transistors with self-aligned angstrom gate length and nanometer channel length
2026
Threshold voltage variations by oxide fixed charges on 22-nm logic fully depleted silicon-on-insulator junction-MOSFETs
2026
SiC MOSFET gate oxide degradation monitoring: a gate leakage current approach
2026 · 1 citations
Tuning the performance of dysprosium oxide thin film as a gate dielectric layer via annealing in concurrent flow of nitrogen and oxygen ambience
2026
Simulation of the Single-Event Burnout in Lateral Enhancement-Mode β-Ga 2 O 3 MOSFET Devices
2026 · 1 citations
Gallium oxide in field effect transistors—A perspective
2026
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