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Time-dependent gate oxide breakdown
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keyword
Time-dependent gate oxide breakdown
RIS
0.000
(Research Intensity Score)
Papers
68
Top papers
High V TH and Improved Gate Reliability in P-GaN Gate HEMTs With Oxidation Interlayer
2023 · 42 citations
Gate Robustness and Reliability of P-Gate GaN HEMT Evaluated by a Circuit Method
2024 · 27 citations
Dielectric breakdown in HfO2 dielectrics: Using multiscale modeling to identify the critical physical processes involved in oxide degradation
2022 · 60 citations
Demonstration of high threshold voltage Tri-gate hybrid ferroelectric gate stack GaN HEMT with 1.2 GW/cm2 Baliga's figure-of-merit and highly robust TDDB stability
2025 · 7 citations
Review on Main Gate Characteristics of P-Type GaN Gate High-Electron-Mobility Transistors
2023 · 22 citations
Homoepitaxial GaN-on-GaN trench MOSFETs with 438 MW/cm2 figure of merit and improved gate reliability
2026
Study of Gate Leakage Current and Failure Mechanism for Schottky-Type p-GaN Gate of GaN HEMTs
2026 · 1 citations
SiC MOSFET gate oxide degradation monitoring: a gate leakage current approach
2026 · 1 citations
High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment
2025 · 2 citations
Newest papers
Homoepitaxial GaN-on-GaN trench MOSFETs with 438 MW/cm2 figure of merit and improved gate reliability
2026
Study of Gate Leakage Current and Failure Mechanism for Schottky-Type p-GaN Gate of GaN HEMTs
2026 · 1 citations
SiC MOSFET gate oxide degradation monitoring: a gate leakage current approach
2026 · 1 citations
A Ti/ITO Bilayer Gate Electrode Strategy for Improving Subthreshold Swing of Oxide Transistors
2026 · 1 citations
Effect of Heavy Ion Radiation on TDDB Properties and Lifetime Prediction of High-k Dielectric Layers
2026
Demonstration of high threshold voltage Tri-gate hybrid ferroelectric gate stack GaN HEMT with 1.2 GW/cm2 Baliga's figure-of-merit and highly robust TDDB stability
2025 · 7 citations
High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment
2025 · 2 citations
Ultrathin Gallium Oxide as Both Surface Passivation Layer with Conductive Filament Contacts and Alternative Gate Dielectric for 2D MOSFETs
2025 · 4 citations
Localized Electric Field Tailoring to Balance Voltage Reliability, Current Density, and High-Frequency Performance of AlGaN/GaN HEMTs
2025 · 2 citations
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